Download Encyclopedia of Materials Characterization: Surfaces, by Charles Evans, Richard Brundle, Wilson PDF

By Charles Evans, Richard Brundle, Wilson

Encyclopedia of fabrics Characterization is a accomplished quantity on analytical recommendations utilized in fabrics technological know-how for the characterization of surfaces, interfaces and skinny motion pictures. This flagship quantity within the fabrics Characterization sequence is a different, stand-alone reference for fabrics technological know-how practitioners, strategy engineers, scholars and somebody with a necessity to grasp in regards to the services on hand in fabrics research. An encyclopedia of fifty concise articles, this booklet may also be a pragmatic significant other to the imminent books within the sequence. It describes widely-ranging options in a jargon-free demeanour and comprises precis pages for every strategy to offer a brief survey of its functions.

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Additional info for Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

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In SFM, also known as Atomic Force Microscopy (AFM), interatomic forces between the atoms on the surface and those on the tip cause the deflection of a microfabricated cantilever. Because the magnitude of the tunneling current or cantilever deflection depends strongly upon the separation between the surface and tip atoms, they can be used to map out surface topography with atomic resolution in all three dimensions. The tunneling current in STM is also a function of local electronic structure so that atomic-scale spectroscopy is possible.

This X-ray spectrum consists of a series of peaks representative of the type and relative amount of each element in the sample. The number of counts in each peak may be further converted into elemental weight concentration either by comparison with standards or by standardless calculations. Range of elements Boron to uranium Destructive No Chemical bonding information Not readily available Quantification Best with standards, although standardless methods are widely used Nominally P5%, relative, > 5yo wt.

The frequency of the E M S is related to the interatomic distance between the absorbing and neighboring atoms. The amplitude of the EXAFS is related to the number, type, and order of neighboring atoms. 3 In Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS) a solid sample, usually placed in ultrahigh vacuum, is exposed to a tunable beam of X rays from a synchrotron radiation source. A spectrum is collected by varying the photon energy of the X rays and measuring the yield of emitted electrons or fluorescent X rays.

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